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Corundum Crusher Quality

This report systematically investigates the influence of different carrier gases (O 2, N 2, and air) on the growth of gallium oxide (Ga 2 O 3) thin films on c-plane sapphire substrates by using the mist-CVD method.Although XRD and Raman measurements show that the pure corundum-structured α-Ga 2 O 3 with single (0006) plane orientation was successfully obtained for all three different carrier

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